ESP: Extended Surface Photometry

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Ada Coda
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ESP: Extended Surface Photometry

Post by Ada Coda » Fri May 30, 2014 11:33 pm

ESP: Extended Surface Photometry

Abstract: ESP (Extended Surface Photometry) determines the photometric properties of galaxies and other extended objects. It has applications that detect flatfielding faults, remove cosmic rays, median filter images, determine image statistics and local background values, perform galaxy profiling, fit 2-D Gaussian profiles to galaxies, generate pie slice cross-sections of galaxies, and display profiling results. It is distributed as part of the Starlink software collection (ascl:1110.012).

Credit: Privett, Grant; Taylor, Mark; Gray, Norman; Draper, Peter W.; Jenness, Tim

Site: http://www.starlink.ac.uk/docs/sun180.htx/sun180.html
http://adsabs.harvard.edu/abs/2012MNRAS.420.3412S

Bibcode: 2014ascl.soft05017P

ID: ascl:1405.017
Last edited by Ada Coda on Sun Feb 03, 2019 8:10 pm, edited 1 time in total.
Reason: Updated code entry.

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