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[ascl:1608.011] PROFFIT: Analysis of X-ray surface-brightness profiles

PROFFIT analyzes X-ray surface-brightness profiles for data from any X-ray instrument. It can extract surface-brightness profiles in circular or elliptical annuli, using constant or logarithmic bin size, from the image centroid, the surface-brightness peak, or any user-given center, and provides surface-brightness profiles in any circular or elliptical sectors. It offers background map support to extract background profiles, can excise areas using SAO DS9-compatible (ascl:0003.002) region files to exclude point sources, provides fitting with a number of built-in models, including the popular beta model, double beta, cusp beta, power law, and projected broken power law, uses chi-squared or C statistic, and can fit on the surface-brightness or counts data. It has a command-line interface similar to HEASOFT’s XSPEC (ascl:9910.005) package, provides interactive help with a description of all the commands, and results can be saved in FITS, ROOT or TXT format.

Code site:
http://www.isdc.unige.ch/~deckert/newsite/Proffit.html
Used in:
http://adsabs.harvard.edu/abs/2013MNRAS.433..812O http://adsabs.harvard.edu/abs/2011A%26A...526A..79E
Bibcode:
2016ascl.soft08011E

Views: 1595

ascl:1608.011
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