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[ascl:1405.017] ESP: Extended Surface Photometry

ESP (Extended Surface Photometry) determines the photometric properties of galaxies and other extended objects. It has applications that detect flatfielding faults, remove cosmic rays, median filter images, determine image statistics and local background values, perform galaxy profiling, fit 2-D Gaussian profiles to galaxies, generate pie slice cross-sections of galaxies, and display profiling results. It is distributed as part of the Starlink software collection (ascl:1110.012).

Code site:
https://github.com/Starlink/starlink http://www.starlink.ac.uk/docs/sun180.htx/sun180.html
Appears in:
http://adsabs.harvard.edu/abs/2005ApJ...624..680K http://adsabs.harvard.edu/abs/2012MNRAS.420.3412S
Bibcode:
2014ascl.soft05017P

ascl:1405.017
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